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SMD

Part number Image IH
(A)
IT
(A)
Vmax
(V)
Imax
(A)
Max.Time-to-trip
(A) (S)
Pdtyp
(W)
Rmin
(Ω)
R1max
(Ω)
LP-USM(L)series 0,05
...
7,50
0,15
...
15,00
30
...
6
10
...
50
0,25
...
37,50
0,02
...
5,00
0,8
...
1,5
3,600
...
0,001
50,000
...
0,007
LP-TSM(L)series 0,04
...
3,00
0,12
...
6,00
15
...
6
3,5
...
50
0,20
...
8,00
0,10
...
5,00
0,5 4,000
...
0,008
40,000
...
0,050
LP-SM series 0,30
...
6,50
0,60
...
13,00
60
...
6
10
...
50
1,5
...
32,5
0,3
...
40,0
1,5
...
2,1
0,700
...
0,001
4,800
...
0,010
1,30
...
2,50
2,60
...
5,00
33
...
15
40 8,0 4,00
...
25,00
2,1
...
1,9
0,080
...
0,025
0,280
...
0,085
LP-NSM(L)series 0,05
...
7,00
0,15
...
14,00
60
...
6
10
...
50
1,00
...
35,00
0,05
...
5,00
0,6
...
1,5
2,000
...
0,001
50,000
...
0,008
LP-MSML series 0,01
...
3,50
0,20
...
9,00
60
...
6
10
...
50
1,5
...
17,5
0,15
...
5,00
1
...
1,5
1,600
...
0,004
15,000
...
0,015
LP-ISM(L)series 0,05
...
2,00
0,15
...
4,00
15
...
6
10
...
50
0,5
...
8,0
0,02
...
5,00
0,5
...
1,2
3,000
...
0,008
50,00
...
0,050


IH = Hold current: maximum current at which the device will not trip at 25°C still air.
IT = Trip current: minimum current at which the device will always trip at 25°C still air.
Vmax = Maximum interrupt voltage device can withstand without damage at rated current.
Imax = Maximum fault current device can withstand without damage at rated voltage.
Max. Time-to-trip = Maximum time to trip(s) at assigned current.
Pdtyp = Typical power dissipation: typical amount of power dissipated by the device when in state air environment.
Rmin = Minimum device resistance at 25°C prior to tripping.
Rmax = Maximum device resistance at 25°C prior to tripping.
R1max = Maximum device resistance measured one hour post-trip at 25°C
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